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半导体电阻应变计空白详细规范评定水平E(可供认证用)
Blank detail Specification for the semiconductor resistance strain gage Assessment level E
参考页数：9P.;A4
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半导体电阻应变计总规范(可供认证用)
General Specification for the semiconductor resistance strain gage
参考页数：17P.;A4
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半导体器件用钝化封装玻璃粉
Glass powder for passivation packaging for ues in semiconduoctor devices
参考页数：7P.;A4
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电子元器件图形库.半导体分立器件图形
Graphic base of electronic components graphics of semiconductor discrete device
参考页数：19P.;A4
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半导体光电耦合器测试方法
Measuring methods for semiconductor photocouplers
参考页数：34P.;A4
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QG21-QG25型高频小功率晶体管F<下标t>测试仪试行检定规程
Trial specification for verification of QG21-QG25 high frequency low-power transistor F testers
参考页数：
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交流固态继电器
AC Solid-state relays
参考页数：21P.;A4
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光纤系统用半导体光电子器件.基本等级和特性的规范模板
Semiconductor optoelectronic devices for fibre optic system applications. Specification template for essential ratings and characteristics
参考页数：40P.;A4
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半导体器件. 机械和气候试验方法. 温度和湿度存储
Semiconductor devices. Mechanical and climatic test methods. Temperature and humidity storage
参考页数：12P.;A4
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半导体器件.机械和气候试验方法.静电放电(ESD)灵敏度测试.人体模型(HBM)
Semiconductor devices. Mechanical and climatic test methods. Electrostatic discharge (ESD) sensitivity testing. Human body model (HBM)
参考页数：44P.;A4
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