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用光致发光光谱法测定硅晶体中杂质浓度的试验方法
Test method for determination of impurity concentrations in silicon crystal by photoluminescence spectroscopy
参考页数:20P;A4
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用光电导衰减法测量硅单晶中少数载流子的寿命
Measuring of minority-carrier lifetime in silicon single crystal by photoconductive decay method
参考页数:7P;A4
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硅片厚度、厚度变化及弯曲的测量方法
Methods of measurement of thickness, thickness variation and bow for silicon wafer
参考页数:6P;A4
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切制硅片及磨光硅片的目视检查
Visual inspection for sliced and lapped silicon wafers
参考页数:4P;A4
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用热电动势法测定锗导电类型
Determination of conductivity type in germanium by thermoelectromotive method
参考页数:3P;A4
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工业硅
Silicon metal
价格:¥0.00
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硅片平坦表面的表面粗糙度测量方法
Test method for measuring surface roughness on planar surfaces of silicon wafer
价格:¥0.00
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工业硅
Silicon metal
价格:¥0.00
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霍尔器件和甘氏器件用砷化镓液相外延片
价格:¥0.00
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