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晶片正面系列字母数字标志规范
Specification for serial alphanumeric marking of the front surface of wafers
价格:¥0.00
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硅抛光回收片
Polished reclaimed silicon wafers
价格:¥0.00
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碲化镉
Cadmium telluride
价格:¥0.00
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非本征半导体中少数载流子扩散长度的稳态表面光电压测试方法
价格:¥0.00
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半导体材料杂质含量红外吸收光谱分析通用导则
General rule of infrared absorption spectral analysis for the impurity concentration in semiconductor materials
价格:¥0.00
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硅外延层厚度测定 堆垛层错尺寸法
价格:¥0.00
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砷化镓用高纯镓中铜、锰、镁、钒、钛等12种杂质的等离子体光谱分析法
Method for the determination of 12 species of impurities including copper,maganese,magnesium,vanadium,titanium in high-purity gallium used for gallium arsenide by ICP spectrometry
价格:¥0.00
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