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水平法砷化镓单晶及切割片
Horizontal bridgman grown gallium arsenide single crystal and cutting wafter
参考页数:12
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挤制热固性和热塑性半导体和绝缘屏蔽的标准规范
Standard Specification for Crosslinked and Thermoplastic Extruded Semi-Conducting, Conductor and Insulation Shielding Materials
参考页数:2P.;A4
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使用SIMS测量溅镀深度剖面接口宽度的标准指南
Standard Guide for Measuring Widths of Interfaces in Sputter Depth Profiling Using SIMS
参考页数:3P.;A4
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定量分析硅化钨半导体加工膜组分和厚度的标准试验方法
Test Method for Quantifying Tungsten Silicide Semiconductor Process Films for Composition and Thickness
参考页数:7P.;A4
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测定在半导体元件上喷镀金属的安全电流脉冲操作区域的标准实施规范 (米制)
Standard Practice for Determining Safe Current Pulse-Operating Regions for Metallization on Semiconductor Components (Metric)
参考页数:5P.;A4
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薄膜电子设备用高纯度金属溅涂靶杂质含量和等级的分析和报告标准指南
Standard Guide for Analysis and Reporting the Impurity Content and Grade of High Purity Metallic Sputtering Targets for Electronic Thin Film Applications
参考页数:2P.;A4
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测量单晶半导体电阻率和霍尔系数并测定霍尔迁移率的标准试验方法
Standard Test Methods for Measuring Resistivity and Hall Coefficient and Determining Hall Mobility in Single-Crystal Semiconductors
参考页数:14P.;A4
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测量硅半导体器件中中子感应位移故障的快速退火标准指南
Standard Guide for Measurement of Rapid Annealing of Neutron-Induced Displacement Damage in Silicon Semiconductor Devices
参考页数:7P.;A4
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挤制热固性和热塑性半导体和绝缘屏蔽的标准规范
Standard Specification for Crosslinked and Thermoplastic Extruded Semi-Conducting, Conductor and Insulation Shielding Materials
参考页数:2P.;A4
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