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空白详细规范:光电晶体管、光电复合晶体管、光电晶体管阵列
Blank detail specification - Phototransistors, photodarlington transistors, phototransistor arrays; German version EN 120003:1992
参考页数:18P.;A4
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有机晶体管和材料特性的试验方法标准
Standard for Test Methods for the Characterization of Organic Transistors and Materials
参考页数:
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表征基于环形振荡器的有机电晶体管特性的试验方法标准
Standard for Test Methods for the Characterization of Organic Transistor-Based Ring Oscillators
参考页数:
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基于环形振荡器的有机晶体管特征描述试验方法
Test Methods for the Characterization of Organic Transistor-Based Ring Oscillators
参考页数:20P;A4
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有机晶体管和材料特征描述试验方法
Test Methods for the Characterization of Organic Transistors and Materials
参考页数:23P;A4
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半导体器件.MOS晶体管上的热载流子试验
Semiconductor devices - Hot carrier test on MOS transistors
参考页数:24P.;A4
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金属氧化物半导体场效应管(MOSFET)的基本温度稳定性试验
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET)
参考页数:27P.;A4
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半导体装置.第6部分:分立器件.三极管
Semiconductor devices - Part 6: Discrete devices - Thyristors
参考页数:254P.;A4
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有机晶体管和材料特性用试验方法的IEEE标准
Test Methods for the Characterization of Organic Transistors and Materials (IEEE Computer Society)
参考页数:24P.;A4
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有机电晶体管环形振荡器特性的试验方法
Test Methods for the Characterization of Organic Transistor-Based Ring Oscillators (IEEE Computer Society)
参考页数:19P.;A4
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