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半导体分立器件 3DK102型NPN硅小功率开关晶体管详细规范
Semiconductor discrete devices.Detail specification for silicon NPN low power switching transistor type 3DK102
参考页数:12P.;A4
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半导体分立器件 3DK28型NPN硅小功率开关晶体管详细规范
Semiconductor discrete devices.Detail specification for silicon NPN low power switching transistor type 3DK28
参考页数:12P.;A4
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半导体装置.分立器件.场效应晶体管
Semiconductor devices. Discrete devices. Field-effect transistors
参考页数:80P;A4
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电子元器件质量评定协调体系规范.空白详细规范.规定环境下有光电晶体管输出的光电耦合器
Specification for harmonized system of quality assessment for electronic components - Blank detail specification - Ambient rated photocouplers with phototransistor output
参考页数:26P;A4
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半导体器件.金属氧化物半导体(MOS)晶体管的热载流子试验
Semiconductor devices - Hot carrier test on MOS transistors
参考页数:14P.;A4
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半导体装置.分立器件.绝缘栅双极晶体管(IGBTs)
Semiconductor devices - Discrete devices - Insulated-gate bipolar transistors (IGBTs)
参考页数:60P.;A4
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电子元器件质量评定协调体系规范.空白详细规范.光电晶体管,光电复合晶体管,光电晶体管阵列
Specification for harmonized system of quality assessment for electronic components - Blank detail specification - Phototransistors, photodarlington transistors, phototransistor arrays
参考页数:22P;A4
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电子元器件用质量评估协调体系规范.空白详细规范.工业用加热三极管
Specification for harmonized system of quality assessment for electronic components - Blank detail specification: industrial heating triodes
参考页数:8P.;A4
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电子元器件质量评估协调体系规范.空白详细规范:电流大于100A的环境温度额定和外壳温度限定反向闭锁三级半导体闸流晶体管
Specification for harmonized system of quality assessment for electronic components - Blank detail specification: reverse blocking triode thyristors, ambient and case-rated, for currents greater than 100 A
参考页数:16P;A4
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金属氧化半导体场效应晶体管(MOSFET)的基本温度稳定性试验
Bias-temperature stability test for metal-oxide, semiconductor, field-effect transistors (MOSFET) (IEC 62373:2006); German version EN 62373:2006
参考页数:14P.;A4
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