标准号: |
BS IEC 60747-7-2010 |
英文名称: |
Semiconductor devices. Discrete devices. Bipolar transistors |
中标分类: |
电子元器件与信息技术>>半导体二极管 |
发布日期: |
2011-02-28 |
发布单位: |
GB-BSI |
标准状态: |
请与本站工作人员进行确认 |
实施日期: |
2011-02-28 |
ICS分类: |
三极管>>三极管 |
起草单位/标准公告: |
BSI |
正文语言: |
英语 |
页数: |
104P;A4 |
被代替标准: |
BS IEC 60747-7-2000;BS IEC 60747-7-5-2005 |
采用关系: |
IEC 60747-7-2010,IDT |
内容提要(CN): |
验收;验收检验;验收试验;双极;双极晶体管;组件;定义(术语);分立式;分立器件;电气工程;电子工程;电子设备及元件;高频;检验;集成电路;布置;寿命;极限(数学);低频;低频工程;作标记;测量;测量技术;微波晶体管;操作时间;功率晶体管;特性;射频;射频设备;标准参考测量方法;基准方法;可靠度;半导体器件;半导体;开关晶体管;符号;试验;晶体管;电压 |
内容提要(EN): |
Acceptance;Acceptance inspection;Acceptance tests;Bipolar;Bipolar transistors;Components;Definitions;Discrete;Discrete devices;Electrical engineering;Electronic engineering;Electronic equipment and components;High frequencies;Inspection;Integrated circuits;Layout;Life (durability);Limits (mathematics);Low frequencies;Low-frequency engineering;Marking;Measurement;Measuring techniques;Microwave transistors;Operating time;Power transistors;Properties;Radiofrequencies;Radiofrequency apparatus;Reference measuring methods;Reference methods;Reliability;Semiconductor devices;Semiconductors;Switching transistors;Symbols;Testing;Transistors;Voltage |
归属: |
英国 |