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挤制热固性和热塑性半导体和绝缘屏蔽的标准规范
Standard Specification for Crosslinked and Thermoplastic Extruded Semi-Conducting, Conductor and Insulation Shielding Materials
参考页数:2P.;A4
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测定在半导体元件上喷镀金属的安全电流脉冲操作区域的标准实施规范 (米制)
Standard Practice for Determining Safe Current Pulse-Operating Regions for Metallization on Semiconductor Components (Metric)
参考页数:5P.;A4
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半导体和电子元件射线检验的标准实施规程
Standard Practice for Radiologic Examination of Semiconductors and Electronic Components
参考页数:10P.;A4
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挤制热固性和热塑性半导体和绝缘屏蔽的标准规范
Standard Specification for Crosslinked and Thermoplastic Extruded Semi-Conducting, Conductor and Insulation Shielding Materials
参考页数:2P.;A4
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测定在半导体元件上喷镀金属的安全电流脉冲操作区域的标准实施规范 (米制)
Standard Practice for Determining Safe Current Pulse-Operating Regions for Metallization on Semiconductor Components (Metric)
参考页数:5P.;A4
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半导体和电子元件射线检验的标准实施规程
Standard Practice for Radiologic Examination of Semiconductors and Electronic Components
参考页数:10P.;A4
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半导体器件. 机械和气候试验方法. 第17部分: 中子辐照
Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation
参考页数:17P.;A4
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半导体器件. 机械和气候试验方法. 第17部分: 中子辐照
Semiconductor devices - Mechanical and climatic test methods - Part 17: Neutron irradiation
参考页数:17P.;A4
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纳米技术.热重量分析法测定单层壁碳纳米管的特性
Nanotechnologies - Characterization of single-wall carbon nanotubes using thermogravimetric analysis
参考页数:22P;A4
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纳米技术.根据细观形状因数确定多层壁碳纳米管的特性
Nanotechnologies - Characterization of multiwall carbon nanotubes - Mesoscopic shape factors
参考页数:18P.;A4
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