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半导体工艺材料测试.液体中痕量元素测定.第2部分:用等离子感应发射分光光度测定法测定氢氟酸中钴(Co)、铬(Cr)、铜(Ca)、铁(Fe)和镍(Ni)的含量
Testing of materials for semiconductor technology - Determination of trace elements in liquids - Part 2: Calcium (Ca), cobalt (Co), chromium (Cr), copper (Cu), Iron (Fe), nickel (Ni) and zinc (Zn) in hydrofluoric acid with plasma-induced emission spectroscopy
参考页数:8P.;A4
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半导体工艺材料的检验.蚀刻混合剂浸蚀率的测定.第1部分:单晶硅测重法
Testing of materials for semiconductor technology; determination of etch rates of etching mixtures; silicium monocrystals; gravimetric method
参考页数:3P.;A4
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半导体工艺技术用材料的试验.电子元件模塑化合物材料的特性表示法.第3部分:阳离子杂质的测定
Testing of materials for semiconductor technology - Method for the characterisation of moulding compounds for electronic components - Part 3: Determination of cationic impurities
参考页数:2P.;A4
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锗的电阻率测试方法
Testing methods of resistivity for germanium
参考页数:3P;A4
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用四点探针法对硅晶体和硅片电阻率的测试方法
Testing method of resistivity for silicon crystals and silicon wafers with four-point probe
参考页数:14P;A4
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太阳能级多晶硅
Solar-grade polycrystalline silicon
价格:¥0.00
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流化床法颗粒硅
Granular polysilicon produced by fluidized bed method
价格:¥0.00
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200 mm硅外延片
200 mm silicon epitaxial wafer
价格:¥0.00
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光伏电池用硅材料中金属杂质含量的电感耦合等离子体质谱测量方法
Test method for measuring metallic impurities content in silicon materials used for photovoltaic applications by inductively coupled plasma mass spectrometry
价格:¥0.00
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采用高质量分辨率辉光放电质谱法测量太阳能级硅中痕量元素的测试方法
Test method for measuring trace elements in photovoltaic-grade silicon by high-mass resolution glow discharge mass spectrometry
价格:¥0.00
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