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半导体器件.分立器件.第7部分:双极晶体管
Semiconductor devices - Discrete devices - Part 7: Bipolar transistors
参考页数：214P.;A4
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半导体装置.分立装置.第4部分:微波二极管和晶体管
Semiconductor devices - Discrete devices - Part 4: Microwave diodes and transistors
参考页数：279P.;A4
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低压浪涌保护装置的元件 第321部分：雪崩击穿二极管（ABD）规范
Components for low-voltage surge protection devices - Part 321: Specifications for Avalanche Breakdown Diode (ABD)
参考页数：31P.;A4
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半导体装置.分立装置.第4部分:微波二极管和晶体管.修改件1
Semiconductor devices - Discrete devices - Part 4: Microwave diodes and transistors
参考页数：9P.;A4
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半导体闸流管二极管冲击保护设备试验规范;勘误表
Errata to IEEE Standard Test Specification for Thyristor Diode Surge Protective Devices
参考页数：11P;A4
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第19部分:晶体管和可控硅用物品特性表格设计
Tabular layouts of article characteristics for transistors and thyristors
参考页数：4P.;A4
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第18部分:半导体二极管用物品特性表格设计
Tabular layouts of article characteristics for semiconductor diodes
参考页数：4P.;A4
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空白详细规范:光电二极管,光电二极管阵列(非光纤用)
Blank detail specification - Photodiodes, photodiode-arrays (not intended for fibre optic applications); German version EN 120005:1992
参考页数：17P.;A4
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半导体器件.分立器件.第3部分:信号二极管(包括开关二极管和稳压二极管)
Semiconductor devices; discrete devices; part 3: signal diodes and regulator diodes; identical with IEC 60747-3:1985
参考页数：34P.;A4
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小型信号二极管的测量方法
Measuring methods for small signal diodes
参考页数：34P;A4
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