标准号: |
DIN 50451-1-2003 |
英文名称: |
Testing of materials for semiconductor technology - Determination of trace elements in liquids - Part 1: Silver (Ag), gold (Au), calcium (Ca), copper (Cu), iron (Fe), potassium (K) and sodium (Na) in nitric acid by AAS |
中标分类: |
冶金>>元素半导体材料 |
发布日期: |
2003-04 |
发布单位: |
DE-DIN |
标准状态: |
请与本站工作人员进行确认 |
ICS分类: |
半导体材料>>半导体材料 |
正文语言: |
德语 |
原文名称: |
Pruefung von Materialien fuer die Halbleitertechnologie - Bestimmung von Elementspuren in Fluessigkeiten - Teil 1: Silber (Ag), Gold (Au), Calcium (Ca), Kupfer (Cu), Eisen (Fe), Kalium (K) und Natrium (Na) in Salpetersaeure mittels AAS |
页数: |
8P.;A4 |
被代替标准: |
DIN 50451-1-1987;DIN 50451-1-2002 |
内容提要(CN): |
半导体工程;钙;银;金属;半导体;定义;微量元素分析;材料;原子吸收光谱测定法;试验;材料试验;含量测定;金;钾;检定;铁;贵金属;硝酸;钠;重金属;高纯度;分析;原子吸收分光光度测定法;半导体工艺;铜;微量元素;纯净水;化学分析和试验;液体 |
内容提要(EN): |
gold;analysis;semiconductor engineering;heavy metals;trace elements;sodium;liquids;copper;noble metals;calcium;testing;silver;metals;nitric acid;atomic absorption spectrometry;definitions;determination of content;materials;definition;potassium;high-purity;superpurity water;materials testing;semiconductors;assay;chemical analysis and testing;atomic absorption spectrophotometry;iron;trace element analysis;semiconductor technology |
归属: |
德国 |
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